Skip to Content
(UB)
School of Engineering and Applied Sciences
||
College of Arts and Sciences
University at Buffalo (UB)
School of Engineering and Applied Sciences
||
College of Arts and Sciences
Science & Engineering Shared Facilities – University at Buffalo
Schedule Lab Time
Search Equipment
Toggle Navigation Menu
7/18/22
Facilities & Equipment
1/2/24
Our Services
1/2/24
Getting Started
12/18/25
Who We Are
11/2/17
Contact Us
3/26/20
News
7/18/22
Facilities & Equipment
1/2/24
Our Services
1/2/24
Getting Started
12/18/25
Who We Are
11/2/17
Contact Us
3/26/20
News
Search
Info For
Info For
UB Researchers
Industry
Other Users
Shared Instrumentation Lab Facilities Descriptions
Schedule Lab Time
Search Equipment
Science & Engineering Shared Facilities – University at Buffalo
>
Facilities & Equipment
>
Search Equipment
>
Function
Facilities & Equipment
BioDesign Core Facility
Cleanroom
Digital Manufacturing Lab
High-Resolution Transmission Electron Microscope Facility
High-Speed 3D Velocimetry System
Materials Characterization Labs
Organic and Stable Isotope Biogeochemistry Lab
Search Equipment
Map and directions
Related Links
2/21/22
Other UB Facilities & Resources
Can't find what you need?
Contact us
.
Browse by Function
Cell and Tissue Culture
7/8/21
CO2 Incubators – VWR® Air Jacketed
7/8/21
Biosafety Cabinet – Labconco REDISHIP Purifier Logic+ Class II A2
Chromatography
8/11/26
Gas Chromatography (GC) – Agilent Technologies 7890B GC with Gas Sampling Valve (GSV)
8/11/26
Gas Chromatography Mass Spectrometry (GC/MS) - Agilent Technologies 7890B GC - 240 Ion Trap MS
8/11/26
High Performance Liquid Chromatography (HPLC) - Agilent Technologies 1260 Infinity
8/11/26
Liquid Chromatography Mass Spectrometer (LCMS) – Agilent Technologies 6470
Deposition
8/11/26
Atomic Layer Deposition Ultratech / Cambridge Nanotech Savannah S100
8/11/26
E-Beam Evaporator with Glancing Angle Deposition (GLAD) - Kurt J. Lesker Company AXXIS
8/11/26
Sputtering Deposition System - Kurt J. Lesker Company® PRO Line PVD 75
Dynamic Light Scattering
11/30/22
Zetasizer - Malvern Panalytical Advance Ultra (Red Label)
Etching
8/11/26
Etcher - Inductively Coupled Plasma Reactive Ion (ICP-RIE) - Trion Technology Oracle III
8/11/26
Etcher - Inductively Coupled Plasma Reactive Ion (ICP-RIE) - Trion Technology Phantom III
Lithography & Photolithography
6/30/25
E-Beam Lithography System (100kV) – Elionix ELS-G100
8/11/26
Four Point Probe System - Jandel CYL-RM3000
8/11/26
Ultraviolet Ozone Cleaning System - UVOCS T10x10/OES
Metrology
8/11/26
Ellipsometer - Film Sense FS-1 Multi-Wavelength
6/30/25
Field Emission Scanning Electron Microscope (FESEM) w/Electron Beam Lithography attachment - JEOL JSM-6500F
3/27/19
Field Emission Scanning Electron Microscope (FESEM) with IXRF Energy-dispersive X-ray Spectrometer (EDS) - Hitachi S4000
6/30/25
Field Emission Scanning Electron Microscope (FESEM) with Oxford Energy-dispersive X-ray Spectrometer (EDS) – Hitachi SU70
6/30/25
Focused Ion Beam Scanning Electron Microscope (FIB-SEM) - Carl Zeiss AURIGA CrossBeam
8/11/26
Four Point Probe System - Jandel CYL-RM3000
8/12/14
Optical Microscopes
8/12/14
Optical Microscopes: AO Epistar and Olympus BH2
8/11/26
Physical Property Measurement System (PPMS) – Quantum Design EverCool II
8/11/26
Porosity Analyzer: Micromeritics Tri-Star II Plus 3030 (surface area) with Micrometrics VacPrep 061 (Sample Degas System)
8/11/26
Profilometer (Stylus) - Veeco Dektak®150
8/11/26
Pycnometry System (gas displacement) - Micromeritics Accu-Pyc II 1340
Microscopy
6/17/26
(Scanning) Transmission Electron Microscope – Thermo Scientific / FEI Talos F200i (S/TEM)
8/11/26
Atomic Force Microscope System - Bruker Dimension Icon with ScanAsyst ®
6/30/25
Field Emission Scanning Electron Microscope (FESEM) w/Electron Beam Lithography attachment - JEOL JSM-6500F
3/27/19
Field Emission Scanning Electron Microscope (FESEM) with IXRF Energy-dispersive X-ray Spectrometer (EDS) - Hitachi S4000
6/30/25
Field Emission Scanning Electron Microscope (FESEM) with Oxford Energy-dispersive X-ray Spectrometer (EDS) – Hitachi SU70
6/30/25
Focused Ion Beam Scanning Electron Microscope (FIB-SEM) - Carl Zeiss AURIGA CrossBeam
8/12/14
Optical Microscopes
8/12/14
Optical Microscopes: AO Epistar and Olympus BH2
8/11/26
Raman Microscope - Renishaw InVia
Sample Preparation and Processing
6/22/21
Centrifugal Evaporating System - Labconco CentriVap® Concentrator System
8/11/26
Freeze Dry System - Labconco FreeZone Triad
1/21/21
Fume Hoods
3/30/22
Sputter Coater System (Precious Metal - Gold) - SPI-Module
8/11/26
Ultraviolet Ozone Cleaning System - UVOCS T10x10/OES
Spectrometry and Spectroscopy
8/11/26
Chemiluminescence NO Analyzer - Eco Physics CLD 88Y
8/11/26
Fluorescence Spectrophotometer - Agilent Technologies Cary Eclipse
8/11/26
Gas Chromatography Mass Spectrometry (GC/MS) - Agilent Technologies 7890B GC - 240 Ion Trap MS
8/11/26
Inductively Coupled Plasma Optical Emission Spectometer (ICP-OES) – Thermo Scientific iCAP PRO XP Duo
8/11/26
Liquid Chromatography Mass Spectrometer (LCMS) – Agilent Technologies 6470
7/6/21
Mass Spectrometer (MS) – Thermo Scientific, Orbitrap XL
8/11/26
Raman Microscope - Renishaw InVia
1/27/21
Raman Spectrometer System (portable) – InPhotonics InPhotote
8/11/26
Universal Measurement Spectrophotometer (UMS) – Agilent Technologies Cary 7000 UV-VIS-NIR
Surface Science
8/11/26
Ellipsometer - Film Sense FS-1 Multi-Wavelength
Thermal Processing and Analysis
8/11/26
Differential Scanning Calorimeter (DSC) Module – TA Instruments DSC Q20
6/17/21
Furnace (tube) - LindbergBlue M™ - Thermo Electron Corp
8/12/14
Rapid Thermal Annealing (RTA) Vacuum Furnace - Ulvac Technology MILA 3000-P-N
8/11/26
Thermogravimetric Analyzer (TGA) & Differential Scanning Calorimeter (DSC) – TA Instruments SDT Q650
Velocimetry
4/14/23
Tomographic Particle Image Velocimetry System (w/4D Particle Tracking) – LaVision FlowMaster
Wafer Bonding
No matching pages.
X-ray Diffraction and Fluorescence
8/11/26
X-ray Diffraction (XRD) System (w/inert atmosphere attachment and heated sample chamber) – Rigaku Ultima IV
1/27/21
X-ray Diffraction System (XRD) – Rigaku Ultima IV
8/11/26
X-ray Fluorescence Spectrometer – Malvern Panalytical Epsilon 1