Materials characterization equipment

Search our equipment database to find the tools you need for your next project.

Metrology

3/23/17
The JEOL JSM-6500F is a Field Emission Scanning Electron Microscope (FESEM) w/Electron Beam Lithography attachment, and Nanometer Pattern Generation Systems (NPGS). It offers high resolution images of very small inorganic and organic surface structures. The NPGS attachment enables lithography applications for semiconductor processing. This system is routinely used to create structures with features down to 50 nm. Higher resolution is possible with sufficient process optimization.
8/12/14
The Hitachi S4000 Field Emission Scanning Electron Microscope (FESEM) with IXRF Energy-dispersive X-ray Spectrometer (EDS) is a cold field emission SEM that is fast and easy to use. Good for microstructure and major and minor elemental analysis. 
8/12/14
The Hitachi SU70 Field Emission Scanning Electron Microscope (FESEM) with Oxford Energy-dispersive X-ray Spectrometer (EDS) is a top level research grade SEM with excellent performance both at low kV for surface imaging and at high kV for EDS analysis. Good for microstructure and major and minor elemental analysis.
3/23/17
The Carl Zeiss AURIGA CrossBeam Focused Ion Beam Electron Microscope is a state-of-the-art advanced scanning electron microscope integrated with high-resolution focused ion beam milling that enables photographic, chemical, and structural analysis of many inorganic and organic samples as well as nanoscale patterning via FIB etching or FIB-driven deposition of metals and insulators from gas-phase precursors. The system also includes TEM liftout, Oxford EDS system, and Avizo imaging interface/software for 3D reconstruction.
8/12/14
Stereoscopes, bright field, dark field, polarizing incident and transmitted optics with digital cameras. 
10/26/16
The Micromeritics Tri-Star II Surface Area and Porosity Analyzer allows for the analysis of surface area and porosity of powders or other nano-structures.
10/26/16
The Micromeritics Accu-Pyc II 1340 Gas Pycnometer provides high-precision volume measurements and density calculations on a wide variety of powders, and solids having volumes from 0.01 to 2000 cm3.

Microscopy

10/26/16
The Atomic Force Microscope System - Bruker Dimension Icon with ScanAsyst® for scanning probe microscopy is capable of nanoscale surface topography and morphology measurements of a range of different surface types producing high resolution, three-dimensional images by scanning a sharp probe over the sample surface.
3/23/17
The JEOL JSM-6500F is a Field Emission Scanning Electron Microscope (FESEM) w/Electron Beam Lithography attachment, and Nanometer Pattern Generation Systems (NPGS). It offers high resolution images of very small inorganic and organic surface structures. The NPGS attachment enables lithography applications for semiconductor processing. This system is routinely used to create structures with features down to 50 nm. Higher resolution is possible with sufficient process optimization.
8/12/14
The Hitachi S4000 Field Emission Scanning Electron Microscope (FESEM) with IXRF Energy-dispersive X-ray Spectrometer (EDS) is a cold field emission SEM that is fast and easy to use. Good for microstructure and major and minor elemental analysis. 
8/12/14
The Hitachi SU70 Field Emission Scanning Electron Microscope (FESEM) with Oxford Energy-dispersive X-ray Spectrometer (EDS) is a top level research grade SEM with excellent performance both at low kV for surface imaging and at high kV for EDS analysis. Good for microstructure and major and minor elemental analysis.
3/23/17
The Carl Zeiss AURIGA CrossBeam Focused Ion Beam Electron Microscope is a state-of-the-art advanced scanning electron microscope integrated with high-resolution focused ion beam milling that enables photographic, chemical, and structural analysis of many inorganic and organic samples as well as nanoscale patterning via FIB etching or FIB-driven deposition of metals and insulators from gas-phase precursors. The system also includes TEM liftout, Oxford EDS system, and Avizo imaging interface/software for 3D reconstruction.
8/12/14
Stereoscopes, bright field, dark field, polarizing incident and transmitted optics with digital cameras. 
10/26/16
The Renishaw inVia Raman Microscope can efficiently provide Raman spectra for chemical composition and structure analysis.

Sample Preparation

10/13/15
Fume hoods available for sample preparation with solvents and acids.

Spectrometry

10/26/16
Chemiluminescence technique is the leading measurement method for detecting nitrogen oxides worldwide. The Eco Physics CLD 88Y et is a vacuum chemiluminescence Nitric Oxide analyzer with a digital display of the concentrations and diagnostic messages. This 800 series analyzer is modularly designed to allow the incorporation of the vacuum pump and thermal ozone scrubber inside the case of the analyzer. It has fast response time, unheated, ambient level chemiluminescence effect with a single reaction chamber. External restriction option (e) and shut off valve (t) provide for flexibility in sample flow rates.
10/26/16
The Cary Eclipse Spectrophotometer uses a Xenon flash lamp to measure the emission of light from samples in four modes. With superior sensitivity, high signal-to-noise ratio and fast kinetics, it captures a data point every 12.5 ms and scans at 24,000 nm/min without peak shifts. 
10/26/16
The Agilent 7890B is a state-of-art gas chromatograph (GC) that provides superior performance for all GC applications with the use of advanced electronic pneumatic control (EPC) modules and high performance GC oven temperature control. The Agilent 240 Ion Trap mass spectrometer (MS), combined with the Agilent 7890B GC, delivers exceptional performance and unsurpassed flexibility with both MS and GC options. The MS is configured in internal mode and provides both electron ionization (EI) and chemical ionization (CI). The 7693 automatic liquid sampler (ALS) works as the interface on 7890B, providing power and communications for one automatic injector and one automatic sampler tray that are easily installed without the need for alignment.
10/26/16
The Thermo Scientific iCAP 6000 Inductively Coupled Plasma Optical Emission Spectrometer (ICP-OES) enables trace metal element analysis for liquid samples.
10/26/16
The Renishaw inVia Raman Microscope can efficiently provide Raman spectra for chemical composition and structure analysis.
9/23/14
The InPhotonics InPhototeTM Portable Raman Spectrometer is useful for rapid identification of chemicals or organic compounds, whether in the field or in the laboratory.  It is a high-quality Raman spectroscopy system in a rugged, portable package, equipped with a database of forensic materials. Most samples can be measured through packaging materials (i.e. glass and plastic). It is capable of identifying chemicals regardless of form (e.g. solids, liquids, slurries). Wet samples or water-based solutions do not pose additional identification difficulties.
9/23/14
The Innov-X Alpha 2 portable X-ray Fluorescence (pXRF) Spectrometer allows analysis in the field or of large specimens. It is used for metal alloy determination or trace element analysis of a selected group of elements. XRF Spectrometry is used to identify elements in a substance and quantify the amount of those elements present. In different modes of operation, the portable XRF can return results on major, minor and trace levels of elements. 

Thermal Processing & Analysis

1/5/17
The TA Instruments DSC Q20 Differential Scanning Calorimeter (DSC) module provides for calorimetric applications. This instrument allows the measurement of differential heat flow from a sample as it is heated to high temperatures.
10/26/16
The TA Instruments DSC SDT Q600 Thermogravimetric Analyzer (TGA) & Differential Scanning Calorimeter (DSC) provides simultaneous measurement of weight change (TGA) and true differential heat flow (DSC) on the same sample from ambient to 1300˚C.

X-ray Diffraction & Fluorescence

10/26/16
The Rigaku Ultima IV is a basic XRD system for analysis of powders, solids and thin film specimens. It provides the crystal structure of materials, and includes a database of materials.
9/23/14
The Rigaku Ultima IV is a basic XRD system for analysis of powders, solids and thin film specimens. It provides the crystal structure of materials, and includes a database of materials.
9/23/14
The Innov-X Alpha 2 portable X-ray Fluorescence (pXRF) Spectrometer allows analysis in the field or of large specimens. It is used for metal alloy determination or trace element analysis of a selected group of elements. XRF Spectrometry is used to identify elements in a substance and quantify the amount of those elements present. In different modes of operation, the portable XRF can return results on major, minor and trace levels of elements.