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Cleanrooms

9/30/26 Atomic Layer Deposition Ultratech / Cambridge Nanotech Savannah S100
9/30/26 E-Beam Evaporator with Glancing Angle Deposition (GLAD) - Kurt J. Lesker Company AXXIS
9/30/26 Sputtering Deposition System - Kurt J. Lesker Company® PRO Line PVD 75

9/30/26 Etcher - Inductively Coupled Plasma Reactive Ion (ICP-RIE) - Trion Technology Oracle III
9/30/26 Etcher - Inductively Coupled Plasma Reactive Ion (ICP-RIE) - Trion Technology Phantom III

9/30/26 Ellipsometer - Film Sense FS-1 Multi-Wavelength
9/30/26 Field Emission Scanning Electron Microscope (FESEM) w/Electron Beam Lithography attachment - JEOL JSM-6500F
9/30/26 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) - Carl Zeiss AURIGA CrossBeam
9/30/26 Four Point Probe System - Jandel CYL-RM3000
9/30/26 Optical Microscopes: AO Epistar and Olympus BH2
9/30/26 Profilometer (Stylus) - Veeco Dektak®150

9/30/26 Field Emission Scanning Electron Microscope (FESEM) w/Electron Beam Lithography attachment - JEOL JSM-6500F
9/30/26 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) - Carl Zeiss AURIGA CrossBeam
9/30/26 Optical Microscopes: AO Epistar and Olympus BH2

9/30/26 E-Beam Lithography System (100kV) – Elionix ELS-G100
9/30/26 Four Point Probe System - Jandel CYL-RM3000
9/30/26 Ultraviolet Ozone Cleaning System - UVOCS T10x10/OES

9/30/26 Fume Hoods
9/30/26 Sputter Coater System (Precious Metal - Gold) - SPI-Module
9/30/26 Ultraviolet Ozone Cleaning System - UVOCS T10x10/OES

9/30/26 Ellipsometer - Film Sense FS-1 Multi-Wavelength

9/30/26 Furnace (tube) - Lindberg Blue M™ - Thermo Electron Corp
9/30/26 Rapid Thermal Annealing (RTA) Vacuum Furnace - Ulvac Technology MILA 3000-P-N

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Materials Characterization

9/30/26 Biosafety Cabinet – Labconco REDISHIP Purifier Logic+ Class II A2
9/30/26 CO2 Incubators – VWR® Air Jacketed

9/30/26 Gas Chromatograph with Flame Ionization Detectors (GC-FID) – Thermo Scientific Trace1310
9/30/26 High Performance Liquid Chromatography (HPLC) - Agilent Technologies 1260 Infinity
9/30/26 Gas Chromatography Mass Spectrometry (GC/MS) - Agilent Technologies 7890B GC - 240 Ion Trap MS
9/30/26 Gas Chromatography (GC) – Agilent Technologies 7890B GC with Gas Sampling Valve (GSV)
9/30/26 Liquid Chromatography Mass Spectrometer (LCMS) – Agilent Technologies 6470

9/30/26 Zetasizer - Malvern Panalytical Advance Ultra (Red Label)

9/30/26 Field Emission Scanning Electron Microscope (FESEM) w/Electron Beam Lithography attachment - JEOL JSM-6500F
9/30/26 Field Emission Scanning Electron Microscope (FESEM) with IXRF Energy-dispersive X-ray Spectrometer (EDS) - Hitachi S4000
9/30/26 Field Emission Scanning Electron Microscope (FESEM) with Oxford Energy-dispersive X-ray Spectrometer (EDS) – Hitachi SU70
9/30/26 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) - Carl Zeiss AURIGA CrossBeam
9/30/26 Optical Microscopes
9/30/26 Physical Property Measurement System (PPMS) – Quantum Design EverCool II
9/30/26 Porosity Analyzer: Micromeritics Tri-Star II Plus 3030 (surface area) with Micrometrics VacPrep 061 (Sample Degas System)
9/30/26 Pycnometry System (gas displacement) - Micromeritics Accu-Pyc II 1340

9/30/26 (Scanning) Transmission Electron Microscope – Thermo Scientific / FEI Talos F200i (S/TEM)
9/30/26 Atomic Force Microscope System - Bruker Dimension Icon with ScanAsyst ®
9/30/26 Field Emission Scanning Electron Microscope (FESEM) w/Electron Beam Lithography attachment - JEOL JSM-6500F
9/30/26 Field Emission Scanning Electron Microscope (FESEM) with IXRF Energy-dispersive X-ray Spectrometer (EDS) - Hitachi S4000
9/30/26 Field Emission Scanning Electron Microscope (FESEM) with Oxford Energy-dispersive X-ray Spectrometer (EDS) – Hitachi SU70
9/30/26 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) - Carl Zeiss AURIGA CrossBeam
9/30/26 Optical Microscopes
9/30/26 Raman Microscope - Renishaw InVia

9/30/26 Centrifugal Evaporating System - Labconco CentriVap® Concentrator System
9/30/26 Freeze Dry System - Labconco FreeZone Triad
9/30/26 Fume Hoods

9/30/26 Chemiluminescence NO Analyzer - Eco Physics CLD 88Y
9/30/26 Fluorescence Spectrophotometer - Agilent Technologies Cary Eclipse
9/30/26 Gas Chromatography Mass Spectrometry (GC/MS) - Agilent Technologies 7890B GC - 240 Ion Trap MS
9/30/26 Inductively Coupled Plasma Optical Emission Spectometer (ICP-OES) – Thermo Scientific iCAP PRO XP Duo
9/30/26 Liquid Chromatography Mass Spectrometer (LCMS) – Agilent Technologies 6470
9/30/26 Mass Spectrometer (MS) – Thermo Scientific, Orbitrap XL
9/30/26 Raman Microscope - Renishaw InVia
9/30/26 Raman Spectrometer System (portable) – InPhotonics InPhotote
9/30/26 Universal Measurement Spectrophotometer (UMS) – Agilent Technologies Cary 7000 UV-VIS-NIR

9/30/26 Differential Scanning Calorimeter (DSC) Module – TA Instruments DSC Q20
9/30/26 Thermogravimetric Analyzer (TGA) & Differential Scanning Calorimeter (DSC) – TA Instruments SDT Q650

9/30/26 Tomographic Particle Image Velocimetry System (w/4D Particle Tracking) – LaVision FlowMaster

9/30/26 X-ray Diffraction (XRD) System (w/inert atmosphere attachment and heated sample chamber) – Rigaku Ultima IV
9/30/26 X-ray Diffraction System (XRD) – Rigaku Ultima IV
9/30/26 X-ray Fluorescence Spectrometer – Malvern Panalytical Epsilon 1

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Browse by Facility Type

Cleanrooms

Deposition

Etching

Metrology

Microscopy

Photolithography

Sample Preparation and Processing

Surface Science

Thermal Processing and Analysis

Wafer Bonding

Materials Characterization

Cell and Tissue Culture

Chromatography

Dynamic Light Scattering

Lyophilization / Freeze Drying

Metrology

Microscopy

Sample Preparation and Processing

Spectrometry and Spectroscopy

Thermal Processing and Analysis

Velocimetry

X-ray Diffraction and Fluorescence

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Info For

Browse by Facility Type

Cleanrooms

Deposition

Etching

Metrology

Microscopy

Photolithography

Sample Preparation and Processing

Surface Science

Thermal Processing and Analysis

Wafer Bonding

Materials Characterization

Cell and Tissue Culture

Chromatography

Dynamic Light Scattering

Lyophilization / Freeze Drying

Metrology

Microscopy

Sample Preparation and Processing

Spectrometry and Spectroscopy

Thermal Processing and Analysis

Velocimetry

X-ray Diffraction and Fluorescence