X-ray Diffraction & Fluorescence

X-ray Fluorescence Spectrometer – Malvern Panalytical Epsilon 1

The Malvern Panalytical Epsilon 1 X-ray fluorescence (XRF) spectrometer enables non-destructive element identification and quantification analysis. It accepts a large variety of sample types, weighing a few hundred milligrams, to larger bulk samples, including large and irregularly shaped objects with maximum dimensions of 15 x 12 x 10 cm (W x D x H).

Features

Sample handing:

  • Highly repeatable sample positioning
  • Sample maximum dimensions: 15 x 12 x 10 cm (W x D x H), 5.9 x 4.7 x 3.9 inches
  • Liquids, solids, slurries, loose powders, filters

Silver Anode X-ray tube (10 W):

  • High-stability ceramic side window
  • 50 µm thin window (Be) for higher intensities 
  • 7 ~ 50 kV, ideal for analyzing heavier elements
  • Silver anode, ideal for phosphorus and sulfur analysis

Silicon Drift Detector:

  • High-resolution, typical 135 eV 
  • 8 µm thin window (Be) for higher intensities 
  • Elemental range: Na - Am

Epsilon Software:

  • Operator mode with big buttons for easy operation 
  • Advanced mode with many features
  • Omnian Factory Calibrated

Location

Materials Characterization Laboratory
Furnas Hall room #109/110
University at Buffalo North Campus
Buffalo, NY 14260

Fees

Fee information to come.

For general inquiries, contact:

Donald J. Goralski
Director, Shared Instrumentation Laboratories
(716) 645-5151

For technical inquiries, contact:

Yulong Huang, PhD
Assistant Professor of Research / Laboratory Manager
Shared Instrumentation Laboratories 
(716) 645-8936