The RENEW Institute - A Multidisciplinary Initiative
Atomic Force Microscope (AFM)
Park FX40 Automatic Atomic Force Microscope
The Park FX40 Automatic Atomic Force Microscope (AFM) System is capable of high spatial resolution surface mapping and is equipped with a True Non-ContactTM mode capable of nanoscale surface analysis of topography, nanomechanics, and electrical, magnetic, and thermal properties with unparalleled sub-nanometer spatial and depth resolutions for three-dimensional sample surface imaging.