Microscopy
(Scanning) Transmission Electron Microscope – Thermo Scientific / FEI Talos F200i (S/TEM)
The Thermo Scientific Talos F200i is a flexible and compact 200 kV FEG (Scanning) Transmission Electron Microscope (S/TEM), designed for fast, precise and quantitative characterization of a wide range of materials. It enables nano-analysis of materials based on high data quality, fast acquisition, and simplified, easy, and automated operation. The Talos F200i combines outstanding quality in high-resolution STEM and TEM imaging, in situ dynamic observations, and diffraction applications with Energy Dispersive X-ray Spectroscopy (EDS).
Contact and Location
Contact:
Yueling Qin, PhD
Laboratory Manager;
Sr. Research Support Specialist
(716) 645-8698
Location:
High Resolution Transmission Electron Microscope (HRTEM) Facility
109 Fronczak Hall
University at Buffalo
North Campus
Buffalo, NY
TEM Photographs
Features
- Configured for 80 or 200 (default) kV operation
- X-CFEG ultra-high brightness Cold Field Emission Gun
- X-twin objective lens
- HAADF-STEM detector and segmented Panther STEM detectors for DPC and iDPC imaging
- Super-X EDS detector system
- Bottom-mounted Ceta-S 16-megapixel CMOS camera
- High-resolution (lattice) imaging with <0.11 nm information limit (at 200 kV)
- 0.14 nm STEM resolution (at 200 kV)
- CompuStage single-tilt and high-visibility low-background double-tilt (hex ring) holders available
- NanoEx-i/v MEMS Holder allows for the characterization and changes to materials at higher temperatures
Features to Come
- EDS Tomography software for 3D chemical information
- Inspect3D Xpress enables alignment of tomographic TEM and STEM images, producing a 3D reconstruction of the data
Fees
- Internal UB Rate: $75/hour
- External Academic Rate: $160/hour
- External Industry Rate: $260/hour
Techinical Support or Assistance:
- Internal UB Rate: $30/hour
- External Rate: $75/hour