X-ray Diffraction & Fluorescence
X-ray Diffraction (XRD) System (w/inert atmosphere attachment and heated sample chamber) – Rigaku Ultima IV
The Rigaku Ultima IV is a basic XRD system for analysis of powders, solids and thin film specimens. It provides the crystal structure of materials, and includes a database of materials.
Features
- Phase identification and quantitative analysis
- Target for x-ray source: Cu
- Operational x-ray tube power: 1.76 kW (40 kV, 44 mA)
- 2θ measuring range: -3 to 162°
- Minimum step size: 0.0001°
- Diffracted beam monochromator
- Focus-beam mode (BB) and parallel-beam mode (PB)
- Slit adjustability: divergence slit, scattering slit, receiving slit, divergence height limiting slit
- Accessories: multiple sample holder, inert atmosphere attachment, heated sample chamber
- PDF-4+ database from International Center for Diffraction Data (ICDD): supports automated quantitative analyses and includes over 300,000 entries, all with digital patterns for use in total pattern analysis. Most entries also include atomic coordinates for quantitative analysis by the Rietveld method. For additional information on PDF-4+ 2014, visit http://www.icdd.com/products/pdf4.htm
Location
Materials Characterization Laboratory
Furnas Hall room #109/110
University at Buffalo North Campus
Buffalo, NY 14260
Fees
Category D Rates
- Internal Academic: $25 per hour
- External Academic: $45 per hour
- Industry: $100 per hour
For general inquiries, contact:
Donald J. Goralski
Director, Shared Instrumentation Laboratories
(716) 645-5151
For technical inquiries, contact:
Yulong Huang, PhD
Process Engineer
Shared Instrumentation Laboratories (716) 645-8936