The Bruker NanoSTAR is a Small angle X-ray scattering (SAXS) instrument for characterizing nanostructured surfaces and nanostructures from 1 nm to around 125 nm.
Small angle X-ray scattering (SAXS) is a useful technique for obtaining information about the shape and size distribution of nanoscale structures with characteristic lengths up to several hundred nanometers. Related properties such as particle agglomeration or the degree of protein folding may also be inferred from SAXS data. In contrast to transmission electron microscopy (TEM), which can give similar information for a selected number of particles in an image, SAXS represents a statistical average over a relatively large volume containing many sample particles and in this respect is complementary to TEM.
Measurement times are fast, with a mirror-conditioned pinhole collimation system, which produces a highly intense, parallel X-ray beam. An efficient circular beam shape is maintained. This eliminates background, so you can analyze weakly scattering samples as well as large structures.
NanoSTAR analyses pure sample properties, even in non-isotropic samples. The detector-to-sample distance can be adjusted from 11.5 mm to 1070 mm.
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