Atomic Force Microscope w/Nanoindenter – Asylum Research MFP-3D™
Atomic Force Microscope w/Nanoindenter – Asylum Research MFP-3D™
The Asylum Research MFP-3D™ Atomic Force Microscope (AFM), is capable of providing three dimensional measurements at the nanometer scale. The instrument features low noise performance and a complete scientific software environment for data processing and analysis. The MFP-3D™ is ideal for many applications including physics, chemistry, biosciences, material science, nanotechnology, polymers, chemistry, nanolithography and quantitative nano measurements.
Operating Modes
Data Acquisition:
Stage
MFP Head
Sample Holders
Software
ARgyle:
Materials Characterization Laboratory
Furnas Hall room #109/110
University at Buffalo North Campus
Buffalo, NY 14260
24/7
Category D Rates
Donald J. Goralski
Director, Shared Instrumentation Laboratories
(716) 645-5151
For technical inquiries, contact:
Viswas S Purohit
Senior Process Engineer
Shared Instrumentation Laboratories
(716) 645-0549