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The Gaertner Scientific Corp. L117 Ellipsometer provides non-contact thickness and refractive index measurements of thin transparent and semi-transparent films to sub-angstrom precision.
Electrical Engineering Cleanroom Davis Hall, Suite 114 University at Buffalo North Campus Buffalo, NY 14260
Ellipsometer - Gaertner Scientific Corp. L 117
Donald J. Goralski Director, Shared Instrumentation Laboratories (716) 645-5151