Microscopy

Atomic Force Microscope w/Nanoindenter – Asylum Research MFP-3D™

Atomic Force Microscope w/Nanoindenter – Asylum Research MFP-3D™.

Atomic Force Microscope w/Nanoindenter – Asylum Research MFP-3D™

Atomic Force Microscope w/Nanoindenter – Asylum Research MFP-3D™.

Atomic Force Microscope w/Nanoindenter – Asylum Research MFP-3D™

The Asylum Research MFP-3D™ Atomic Force Microscope (AFM), is capable of providing three dimensional measurements at the nanometer scale. The instrument features low noise performance and a complete scientific software environment for data processing and analysis. The MFP-3D™ is ideal for many applications including physics, chemistry, biosciences, material science, nanotechnology, polymers, chemistry, nanolithography and quantitative nano measurements.

Features

Operating Modes

  • Contact Mode: Imaging using feedback on deflection. Height, deflection, and lateral force signals available.
  • AC and Dual AC™: Q-controlled imaging using feedback on amplitude. Signals include height, amplitude/phase, I/Q, deflection; both air and fluid.
  • Force Mode: Force curve acquisition in contact or AC mode. All signals available.
  • Lateral Force: Frictional force imaging
  • MicroAngelo: Built-in nanolithography / nanomanipulation.

Data Acquisition:

  • Capture data at 5MHz for up to two million points continuously.

Stage

  • Micrometer driven stage for mechanical alignment of the cantilever tip and sample
  • Noise: <0.02nm Adev in a 0.1Hz to 1kHz BW.

MFP Head

  • Standard Head: Flexure-mounted optical lever system with low-coherence SLD, liquid-compatible and AC-capable cantilever holder, dichroic mirror and window for optical access to cantilever, 80-pitch engage screws, and Invar shell.

Sample Holders

  • For samples up to 3.4"x1.5", including glass slides and coverslips.

Software

  • Open user interface based on IGOR Pro incorporates professional-quality analysis and graphing capabilities. AFM analysis includes section, histogram, roughness, particle analysis, and masking.
  • Features include but not limited to:
    • Nonlinear curve fitting to arbitrary user-defined functions.
    • Extensive image analysis including 2D FFT’s, wavelet transformations, convolutions, line profiles, particle analysis, edge detection (eight methods, including Sobel), and thresholding (five methods, including fuzzy entropy).
    • Automatic spectral fitting and calibration of cantilever spring constants using thermal noise and Sader method.
    • Easy generation of scientific publication quality graphs and page layouts.

ARgyle:

  • OpenGL® 3D rendering technology for advanced image display.
  • Generate, display, and visualize 3D images in real-time while you scan as well as off-line processing. Overlay alternate channel data with primary to view feature correlation.
  • Independent scaling of axes for true 1:1 aspect ratio.
  • Mouse-driven rotating, panning, scaling, and specular lighting control of images.
  • Export 3D images to clipboard, JPEG, TIFF, BMP, PNG, STL, VRML 2.0.
  • Stereo anaglyph creation from 3D images.

Location

Materials Characterization Laboratory
Furnas Hall room #109/110
University at Buffalo North Campus
Buffalo, NY 14260

Hours of operation

24/7

Fees

Category D Rates

  • Internal Academic: $25 per hour
  • External Academic: $45 per hour
  • Industry: $100 per hour
For general inquiries, contact:

Donald J. Goralski
Director, Shared Instrumentation Laboratories
(716) 645-5151

For technical inquiries, contact:

Viswas S Purohit
Senior Process Engineer
Shared Instrumentation Laboratories
(716) 645-0549