Spectrometry & Spectroscopy

Time-of-Flight Secondary Ion Mass Spectrometer – ION TOF.SIMS Model 5-100

ION TOF. TOF-SIMS  5, Ultra high vacuum time-of-flight mass spectrometer for chemical imaging, ion intensity mapping, depth profiling, and static mass spectra. This equipment is engineered for the characterization and analysis of smooth, flat, and solid samples. Ideal applications include analysis of glass, silicon wafers, thin polymer films such as commercial plastics, coatings, and paints. Other possible applications include particulate analysis, and geological samples, microtomed plant and animal tissue. Surface imaging with 100nm resolution is routine given idealized conditions. Excellent for failure analysis of microcircuits, micro- and nano-scale electronic devices.

Experimental samples, techniques, and procedures are permitted with approval from the lab coordinator.

Features

  • 25-50 keV Bismuth liquid metal Ion gun (analysis, imaging, pulsed or direct ion current capabilities)
  • 1-10 keV Cs ionization source (depth profiling, sputtering, analysis)
  • 2-10 keV C+, C++, C+++ ionization source (depth profiling,  sputtering, analysis)
  • Interlaced and non-interlaced depth profiling
  • Reflectron time of flight mass analyzer with negative and positive ion extraction modes
  • Raster size (analysis area/ sputter crater size) from 10 x 10 microns to 500 x 500 microns
  • Cryogenic  and heated sample handling capabilities
  • Can handle large batches as many as 15 samples at a time (limited to 1.5cm x1.5cm)
  • Or large single samples of up to 6 cm x 9 cm
  • Frozen samples up to 1 cm x 1 cm
  • 5-axis sample stage manipulation. (x,y,z, tilt, and rotate)
  • Limits of detection in the ppb- sub ppb range
  • High mass resolving power
  • Analyzer has a mass range from 1 amu - 13,000 amu

Location

Surface and Thin Film Laboratories
482 Natural Sciences Complex
University at Buffalo North Camus
Buffalo, NY 14260 

Fees

Usage Fee:

Unassisted:    $36/hour (academic)

                    $245/ hour (industry) 

Assisted:        $70/ hour (academic)

                    $435/ hour (industry)

Complimentary 30 minute consultation

Bruker Dimension Icon Atomic Force Microscope with ScanAsyst

For inquiries, contact:

Austin Quinn

PhD Candidate, Department of Chemistry

(716) 645-4171