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Equipment and Instrumentation Portal (EQUIP)

X-ray Diffraction & Flourescence

X-ray Diffraction (XRD) System (w/inert atmosphere attachment and heated sample chamber) – Rigaku Ultima IV

The Rigaku Ultima IV is a basic XRD system for analysis of powders, solids and thin film specimens. It provides the crystal structure of materials, and includes a database of materials.

Features

  • Phase identification and quantitative analysis
  • Target for x-ray source: Cu
  • Operational x-ray tube power: 1.76 kW (40 kV, 44 mA)
  • 2θ measuring range: -3 to 162°
  • Minimum step size: 0.0001°
  • Diffracted beam monochromator
  • Focus-beam mode (BB) and parallel-beam mode (PB)
  • Slit adjustability: divergence slit, scattering slit, receiving slit, divergence height limiting slit
  • Accessories: multiple sample holder, inert atmosphere attachment, heated sample chamber
  • PDF-4+ database from International Center for Diffraction Data (ICDD): supports automated quantitative analyses and includes over 300,000 entries, all with digital patterns for use in total pattern analysis.  Most entries also include atomic coordinates for quantitative analysis by the Rietveld method. For additional information on PDF-4+ 2014, visit http://www.icdd.com/products/pdf4.htm

Location

Materials Characterization Laboratory
Furnas Hall room #109/110
University at Buffalo North Campus
Buffalo, NY 14260

Fees

Usage Fee: Category B Rates

$25/hour (academic), $100/hour (industry)

X-ray Diffraction (XRD) System (w/inert atmosphere attachment and heated sample chamber) – Rigaku Ultima IV

X-ray Diffraction (XRD) System (w/inert atmosphere attachment and heated sample chamber) – Rigaku Ultima IV

For general inquiries, contact:

Donald J. Goralski

Director, Shared Instrumentation Laboratories

(716) 645-5151

 

For technical inquiries, contact:

Zongmin (Shirley) Bei, PhD

Senior Research Support Specialist

Shared Instrumentation Laboratories 

(716) 645-5165